Characterization and metrology are the basis of nanoscience and nanotechnology, which aim at developing state-of-the-art techniques and accurate measurements for characterizing various nanostructures ranging from surface topographies, individual nanoparticles to bulk nanomaterials, to enable and promote applications of nanotechnology in research, development and industry. This session covers characterization and metrology of all types of nanostructures including inorganic, organic and carbonaceous.
Topics include but not limited to:
Single molecule physics and chemistry; surface science; high-resolution structural characterization; high resolution chemical and biological recognition; nanoscale electrical/optical/mechanical characterization; sub-surface nanoscale imaging and characterization; modeling and simulation for nanocharacterization; traceable measurements and instrumentation; uncertainty assessment associated with nanoscale measurements; reference materials and standards.
National Center for Nanoscience and Technology, China
National Center for Nanoscience and Technology, China
Southeast University, China
Peking University, China